Facilities & Instrumentation
The Berrie Lab and offices are located in Gray-Little Hall (Interdisciplinary Science Building, ISB) at the University of Kansas. The equipment below is located in our labs in the basement of the building.
Atomic Force Microscopes
We have three Atomic Force Microscopes (AFM) that allow us to investigate the surface topography as well as probe properties including electrical conductivity and surface potential. In addition, we use these microscopes to fabricate materials at the nanoscale. These are all Digital Instruments/Bruker systems with various controllers and scanners.
UHV Scanning Probe Microscope
An RHK UHV AFM/STM system has been coupled to ALD and MBE growth chambers for investigation of in situ growth and fabrication of devices. This instrument is capable of performing both scanning tunneling and atomic force microscopy experiments on a variety of materials under ultrahigh vacuum conditions.
Ellipsometer
A Rudolph Auto EL III ellipsometer is used to measure film thicknesses at the nanoscale.
FTIR Spectroscopy
A Thermo Nicolet 670 Series FTIR spectrometer with a VeeMax accessory is used for grazing angle reflection FTIR measurements to characterize thin film samples.
Contact Angle Goniometer
A Rame-Hart goniometer is available for measurements of contact angle of liquids at interfaces.