Facilities & Instrumentation


The Berrie Lab and offices are located in Gray-Little Hall (Interdisciplinary Science Building, ISB) at the University of Kansas. The equipment below is located in our labs in the basement of the building.

Atomic Force Microscopes

Atomic Force Microscopes

We have three Atomic Force Microscopes (AFM) that allow us to investigate the surface topography as well as probe properties including electrical conductivity and surface potential. In addition, we use these microscopes to fabricate materials at the nanoscale. These are all Digital Instruments/Bruker systems with various controllers and scanners.
UHV Scanning Probe Microscope

UHV Scanning Probe Microscope

An RHK UHV AFM/STM system has been coupled to ALD and MBE growth chambers for investigation of in situ growth and fabrication of devices. This instrument is capable of performing both scanning tunneling and atomic force microscopy experiments on a variety of materials under ultrahigh vacuum conditions.
Ellipsometer

Ellipsometer

A Rudolph Auto EL III ellipsometer is used to measure film thicknesses at the nanoscale.
FTIR Spectroscopy

FTIR Spectroscopy

A Thermo Nicolet 670 Series FTIR spectrometer with a VeeMax accessory is used for grazing angle reflection FTIR measurements to characterize thin film samples.
Contact Angle Goniometer

Contact Angle Goniometer

A Rame-Hart goniometer is available for measurements of contact angle of liquids at interfaces.
Thin Film Evaporator

Thin Film Evaporator

An Edwards Auto 306A diffusion pumped vacuum evaporator is available for the deposition of thin films. It contains thermal evaporation sources as well as substrate heaters and a QCM for measurement of film thickness and deposition rate.